Overview
The LCR-P1 Transistor Tester is a high-precision, multifunctional electronic testing device designed specifically for electronic engineers, technicians, and enthusiasts.This device is intended for detecting and analyzing the performance and characteristics of semiconductor components such as transistors, diodes, triodes, and field-effect transistors (FETs).Equipped with a color screen, it allows for multi-parameter measurement of various components, automatically identifies the type and pin arrangement of the tested component, simplifying the operation process and enhancing testing efficiency.
Features
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Intelligent anti-burning design: Uncharged capacitors automatically discharge upon insertion, with a user-friendly protection mechanism to prevent damage.
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Data export: Supports connecting to a computer to export data, easily transferring the collected measurement data to facilitate further in-depth analysis on the computer.
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Alternate Measuring Modes: Innovatively incorporates replaceable test boards, easily tackling diverse test needs for unprecedented convenience and efficiency.
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Intelligent Recognition Components：Simply Plug & Clamp, One-Button Quick Identification of Component Parameters, Saving Time and Effort.
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Zener diode independent measurement: Independent measurement channel for measure diodes, measuring 0.01-32V with pre-measurement power supply for precise results.
Specifications
- Model : LCR-P1
- Dimensions : 13x8.5x4.5mm
- Power Supply : Battery
- Display Type : Digital Only
- Transistor range : 10 < B < 600
- Capacitance Range : 25pF-100mF
- Inductance range : 10μh-1000μh
- Resistance Range : 0.01Ω-50MΩ
- Diode : Forward voltage < 4.5V
- Voltage Regulator Diode : 0.01-4.5V / 0.01-32V
- Field-Effect Transistor : JFET / IGBT / MOSFET
- Bidirectional Thyristor : Turn-on voltage < 5V, Gate trigger current < 6mA
- IR Decoding : NEC protocol IR code
- Display : 1.44'' Color Screen
- Power Supply : 300mAh lithium battery
- Operating Temperature : 0~40℃
- Charging : USB Type-C, 5V/1A
- Anti-burn protection : supported
- Data Export : supported
- Firmware upgrade : supported
Downloads
Additional Information
| Device |
Tester |
| Type |
Multifunction | Transistor | Capacitor |
| References |
Firmware
|
